Developing Novel Approaches to Thin Film Microscopic Image Analysis

Rashi Tyagi, Rashi Dhenia, Stephan Gerve, and Harika Komreddy

We analyzed detected grain boundaries from thin-film samples using image processing and machine learning. These grain boundaries are important because they help determine the physical properties of new transistors.

Group Members

R T

Rashi Tyagi

Computer Science
School of Science

R D

Rashi Dhenia

Computer Engineering
School of Engineering and Technology

S G

Stephan Gerve

Computer Engineering
School of Engineering and Technology

H K

Harika Komreddy

Neuroscience
School of Science